Jetzt anpassen und kaufen
39,60 €
exkl. USt.
Konfigurieren
Norm
OVE EN IEC 63202-1
Ausgabedatum: 2020 05 01
Photovoltaic cells -- Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells ((IEC 63202-1:2019) EN IEC 63202-1:2019) (english version)
This part of IEC 63202 describes procedures for measuring the light-induced degradation (LID)
of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The m...
Weiterlesen
Gültig
Herausgeber:
Österreichischer Verband für Elektrotechnik
Format:
Digital | 18 Seiten
Sprache:
Englisch
ICS
This part of IEC 63202 describes procedures for measuring the light-induced degradation (LID)
of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a
crystalline silicon PV cell is determined by comparing maximum output power at Standard
Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified
temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV
module manufacturers in minimizing the mismatch between cells within the same module,
thereby maximizing power yield.
When compared to PV module LID measurements described in the IEC 61215 series, several
extra experimental factors have been found to show significant impact on the PV cell LID test,
which were not considered by IEC 61215-2. This document provides a conditioning and
measurements procedure and parameter settings required for consistent PV cell LID
measurements.
LID magnitude is one important factor of cell quality. For cells from the same sorting bin, the
most important factor is the distribution of output power after LID.