Jetzt anpassen und kaufen
113,90 €
exkl. USt.
Konfigurieren
Norm
ÖVE/ÖNORM EN 62047-11
Ausgabedatum: 2014 06 01
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (IEC 62047-11:2013) (english version)
Gültig
Herausgeber:
Austrian Standards International
Format:
Digital | 28 Seiten
Sprache:
Englisch
Fachgebiete
IT, communication & electronic, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general
IT, communication & electronic, Electronic components, Other semiconductor devices
IT, communication & electronic, Electronic components, Semiconductor devices in general
Electric & lighting engineering, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general
ÖVE/ÖNORM EN 62047-11
2014 06 01
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of l...
Norm
↖