Jetzt anpassen und kaufen
154,70 €
exkl. USt.
Konfigurieren
Norm

ISO 13424:2013

Ausgabedatum: 2013 09 23

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the ...
Weiterlesen
Gültig
Herausgeber:
International Organization for Standardization
Format:
Digital | 46 Seiten
Sprache:
Englisch

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.

ISO 13424:2013
2013 09 23
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film ana...
Norm