Jetzt anpassen und kaufen
79,20 €
exkl. USt.
Konfigurieren
Norm
ÖVE/ÖNORM EN 60749-27
Ausgabedatum: 2013 07 01
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012) (english version)
This part of IEC 60749 establishes a standard procedure for testing and classifying
semiconductor devices according to their susceptibility to damage or degradation by e...
Weiterlesen
Gültig
Herausgeber:
Austrian Standards International
Format:
Digital | 24 Seiten
Sprache:
Englisch
ICS
This part of IEC 60749 establishes a standard procedure for testing and classifying
semiconductor devices according to their susceptibility to damage or degradation by exposure
to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an
alternative test method to the human body model ESD test method. The objective is to
provide reliable, repeatable ESD test results so that accurate classifications can be performed.
This test method is applicable to all semiconductor devices and is classified as destructive.
ESD testing of semiconductor devices is selected from this test method, the human body
model (HBM – see IEC 60749-26) or other test methods in the IEC 60749 series. The MM and
HBM test methods produce similar but not identical results. Unless otherwise specified, the
HBM test method is the one selected.
ÖVE/ÖNORM EN 60749-27
2013 07 01
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD...
Norm
↖
ÖVE/ÖNORM EN 60749-27
2007 03 01
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlich...
Norm