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Norm
ÖVE/ÖNORM EN 61788-15
Ausgabedatum: 2012 09 01
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies (IEC 61788-15:2011) (english version)
This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of
HTS films at microwave frequencies by a modified two-resonance mode dielectric r...
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Herausgeber:
Austrian Standards International
Format:
Digital | 56 Seiten
Sprache:
Englisch
ICS
This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of
HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator
method [13, 14]2. The object of measurement is to obtain the temperature dependence of the
intrinsic ZS at the resonant frequency f0.
The frequency and thickness range and the measurement resolution for the intrinsic ZS of
HTS films are as follows:
- frequency: up to 40 GHz;
- film thickness: greater than 50 nm;
- measurement resolution: 0,01 mO at 10 GHz.
The intrinsic ZS data at the measured frequency, and that scaled to 10 GHz, assuming the f2
rule for the intrinsic surface resistance RS (f < 40 GHz) and the f rule for the intrinsic surface
reactance XS for comparison, shall be reported.
ÖVE/ÖNORM EN 61788-15
2012 09 01
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of...
Norm
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