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Norm

ÖVE/ÖNORM EN 62258-2

Ausgabedatum: 2012 02 01

Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2011)

This Part of ÖVE/ÖNORM EN62258 specifies the data formats that may be used for the exchange of data which is covered by other parts of the ÖVE/ÖNORM EN 62258 series, as w...
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Herausgeber:
Austrian Standards International
Format:
Digital | 67 Seiten
Sprache:
Englisch
This Part of ÖVE/ÖNORM EN62258 specifies the data formats that may be used for the exchange of data which is covered by other parts of the ÖVE/ÖNORM EN 62258 series, as well as definitions of all parameters used according to the principles and methods of ÖVE/ÖNORM EN 61360. It introduces a Device Data Exchange (DDX) format, with the prime goal of facilitating the transfer of adequate geometric data between die manufacturer and CAD/CAE user and formal information models that allow data exchange in other formats such as STEP physical file format, in accordance with ISO 10303-21, and XML. The data format has been kept intentionally flexible to permit usage beyond this initial scope. It has been developed to facilitate the production, supply and use of semiconductor die products, including but not limited to: - wafers, - singulated bare die, - die and wafers with attached connection structures, - minimally or partially encapsulated die and wafers. This standard reflects the DDX data format at version 1.3.0
ÖVE/ÖNORM EN 62258-2
2012 02 01
Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2011)
Norm
ÖVE/ÖNORM EN 62258-2
2006 01 01
Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2005)
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