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Technische Regel

ISO/TS 10867:2010

Ausgabedatum: 2010 09 15

Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. ISO...
Weiterlesen
ZURÜCKGEZOGEN : 2019 12 05
Herausgeber:
International Organization for Standardization
Format:
Digital | 14 Seiten
Sprache:
Englisch

ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.

The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.

ISO/TS 10867:2019
2019 12 04
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photolumines...
Technische Regel
ISO/TS 10867:2010
2010 09 15
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photolumines...
Technische Regel
Technische Regel
ISO/TS 10867:2019
Ausgabedatum : 2019 12 04
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy